Dependence of Conductivity and Carrier Mobility on Thickness and Annealing Temperature of a- Ge:Sb Films. International Journal of Current Engineering and Technology, [S. l.], v. 5, n. 3, p. 1542–1546, 2015. Disponível em: https://ijcet.evegenis.org/index.php/ijcet/article/view/2138. Acesso em: 6 apr. 2026.