Scalable Machine Learning Pipelines for Big Telemetry Data in Semiconductor Manufacturing. International Journal of Current Engineering and Technology, [S. l.], v. 15, n. 4, p. 335–344, 2025. Disponível em: https://ijcet.evegenis.org/index.php/ijcet/article/view/1680. Acesso em: 12 mar. 2026.