Study the Effect of Annealing Temperature on the Structural, Morphology and Electrical Properties CoPc Thin Films. International Journal of Current Engineering and Technology, [S. l.], v. 4, n. 5, p. 3263–3269, 2014. Disponível em: https://ijcet.evegenis.org/index.php/ijcet/article/view/1234. Acesso em: 13 jun. 2026.